Characterization of high Tc materials and devices by - download pdf or read online

By Nigel D. Browning, Stephen J. Pennycook

ISBN-10: 0511039662

ISBN-13: 9780511039669

ISBN-10: 0511534825

ISBN-13: 9780511534829

It is a transparent and up to date account of the appliance of electron-based microscopies to the learn of high-Tc superconductors. Written by means of best specialists, this compilation offers a accomplished evaluate of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, including information of every procedure and its functions. Introductory chapters conceal the fundamentals of high-resolution transmission electron microscopy, together with a bankruptcy dedicated to specimen practise innovations and microanalysis by means of scanning transmission electron microscopy. resulting chapters study id of latest superconducting compounds, imaging of superconducting homes by way of low-temperature scanning electron microscopy, imaging of vortices through electron holography and digital constitution choice by means of electron strength loss spectroscopy. using scanning tunneling microscopy for exploring floor morphology, progress techniques and the mapping of superconducting provider distributions can be mentioned. ultimate chapters think about purposes of electron microscopy to the research of grain limitations, skinny motion pictures and machine constructions. distinctive references are incorporated. This e-book will curiosity graduate scholars and researchers in condensed subject physics and fabric technological know-how.

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Extra info for Characterization of high Tc materials and devices by electron microscopy

Example text

Furthermore, since the ®eld-emission beam has a high current 23 24 A. Tonomura density even under collimated illumination, a necessary condition for forming an electron hologram, a hologram on a ¯uorescent screen can be seen with the naked eye, thus making dynamic observation using computers and optical devices possible. Thanks to these technical developments, phase information from an electron beam can now be used to observe and measure objects hitherto inaccessible by electron microscopy. 2 Electron holography Electron holography is a two-step imaging method.

12(c) and (e)). This is not the case in the bright-spot images ((b) and (d)); bright spots always appear at the oxygen column sites regardless of the oxygen occupation. These results show that the ¯uctuation in intensity at the oxygen column sites of Fig. 11(b) is intuitively interpretable, while that of Fig. 11(a) is not; the dark spots of oxygen columns are clearly visible only at the sites marked by small arrows in Fig. 11(b). Similar investigations to these can be carried out for other regions in Fig.

208. 5 nm at the entrant surface of the foil, is largely wasted even in a ®lm of carbon 50 nm thick, if all the transmitted electrons or the secondary signals produced from them are used as a signal. The beam broadening effect in YBCO is comparable with that of the Cu. The fact that the probe broadens as the 3a2 power of the ®lm thickness is easily understood: the number of collisions is taë, where ë is the mean free path for scattering. The inelastic scattering is to very small angles, so it is the elastic scattering which predominates.

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Characterization of high Tc materials and devices by electron microscopy by Nigel D. Browning, Stephen J. Pennycook

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